SRI.M. MADHUSUDHAN REDDY. Ultra Low Power Memory Reliability Circuits for Error Detection and Correction. Mathematical Statistician and Engineering Applications, [S. l.], v. 71, n. 1, p. 677–684, 2022. Disponível em: https://philstat.org/index.php/MSEA/article/view/2914. Acesso em: 3 jul. 2024.